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by Jerald R. Izatt

  • ISBN: 0892527013
  • Category: Engineering
  • Author: Jerald R. Izatt
  • Subcategory: Engineering
  • Other formats: rtf mbr lrf lit
  • Language: English
  • Publisher: Society of Photo Optical (September 1, 1986)
  • Pages: 219 pages
  • FB2 size: 1410 kb
  • EPUB size: 1334 kb
  • Rating: 4.6
  • Votes: 504
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PROCEEDINGS VOLUME 0666. Far-Infrared Science and Technology.

PROCEEDINGS VOLUME 0666. The discussion is confined to the following four detector types: (1) the Schottky diode, (2) the bulk InSb detector, (3) the Ge:Ga photoconductor and (4) the SIS (luasiparticle mixer.

Far-Infrared Science and Technology

Far-Infrared Science and Technology. 1 Sessions, 24 Papers, 0 Presentations. Far infrared measurements between 10 and 250 cm-1 characterize and probe II-VI semiconductor systems of current scientific and technical interest including: the leading infrared detector material Hg1-xCdxTe; the substrate materials CdTe and Cd1-xZnxTe; the magnetic semiconductor Hgl-xMnxTe; and the new HgTe-CdTe superlattice.

These are some of the critical components needed to enable far-IR direct-detection interferometers. Article in Proceedings of SPIE - The International Society for Optical Engineering · January 2003 with 5 Reads. Cite this publication. These are some of the critical components needed to enable far-IR direct-detection interferometers.

Proceedings Despite the ubiquity and maturity of imaging systems in the modern world, new imaging technologies continue to emerge that allow humanity to see into new spaces.

Each year SPIE conferences result in approximately 350 proceedings volumes comprising 16,000+ papers and presentation recordings reporting on photonics-driven advancements in areas such as biomedicine, astronomy, defense and security, renewable energy, and more. Recent SPIE Conferences Browse by Year Browse by Volume Number. Despite the ubiquity and maturity of imaging systems in the modern world, new imaging technologies continue to emerge that allow humanity to see into new spaces.

Progress in far-infrared detection technology

Progress in far-infrared detection technology. A technique based on infrared microscopy and the automatic fitting of the transmissivity curves has been developed to measure the composition and thickness distributions of HgCdTe wafers grown by molecular beam epitaxy (MBE). This technique has the ability to handle many measuring points, provides high spatial resolution, and can be used for the routine characterization of the uniformity of HgCdTe grown on CdZnTe and Si-based substrates.

Far-infrared science and technology; Proceedings of the Meeting, Quebec, Canada, June 5, 6, 1986.

A continuously tunable far-IR Raman laser has been used to measure the responsivity and the spectral response of uncoated LiTaO(3) pyroelectric detectors between 230 and 530 microm. A striking feature of the spectral response curves is a periodic sequence of maxima and minima, with a modulation factor of / 75%. Far-infrared science and technology; Proceedings of the Meeting, Quebec, Canada, June 5, 6, 1986.

Другие названия журнала: PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL . VA, US, Progress in Biomedical Optics and Imaging - Proceedings of SPIE, SPIE Proc, SPIE Proc.

Другие названия журнала: PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, Pr. PIE, Proc SPIE In. Proceedings of SPIE - The International Society for Optical Engineering Passive Millimeter-Wave Imaging Technology IV, SPIE Proc. Image and Signal Processing for Remote Sensing X, SPIE Proc.

PROCEEDINGS OF SPIE Satellite Data Compression, Communications . Publication of record for individual papers is online in the SPIE Digital Library.

Publication of record for individual papers is online in the SPIE Digital Library.

Proceedings of SPIE is the conference record of the Society of Photo-Optical Instrumentation Engineers (SPIE). The first proceedings were published in 1963. Proceedings of SPIE is indexed and abstracted in: Astrophysics Data System. International Aerospace Abstracts. Index to Scientific & Technical Proceedings.

Far-Infrared Properties of Solids. Proceedings of a NATO Advanced Study Institute, Delft, The Netherlands, Aug. 1968. S. Mitra and S. Nudelman, Eds. Plenum, New York, 1970. By William B. Tiffany. Science 16 Jun 1972: Vol. 176, Issue 4040, pp. 1230 DOI: 1. 126/science.



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